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I have done some googling, but have not found an answer I feel sure about. I have just started experimenting with smartcl. I found this same error on a new laptop that I sold where a client was having some occasional crashes. I also found this today on a new machine we are diagnosing. Any insight would be greatly appreciated. I ran this hard drive test directly from the laptop(not easy to remove).
type "interface crc error, command aborted"
below is the exact output from the log file
type "interface crc error, command aborted"
below is the exact output from the log file
smartctl 6.0 2012-10-10 r3643 [i686-linux-3.7.9-pmagic] (local build)
Copyright (C) 2002-12, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 2.5" HDD (80 GB and above)
Device Model: TOSHIBA MK2035GSS
Serial Number: X7MWF0PYS
Firmware Version: DK022A
User Capacity: 200,049,647,616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Thu Apr 4 15:51:50 2013 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 130) minutes.
SCT capabilities: (0x0001) SCT Status supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 839
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 1769
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 078 078 000 Old_age Always - 9191
10 Spin_Retry_Count 0x0033 135 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1764
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 7
193 Load_Cycle_Count 0x0032 084 084 000 Old_age Always - 162647
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 33 (Min/Max 4/46)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 132
222 Loaded_Hours 0x0032 082 082 000 Old_age Always - 7576
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 315
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 1564 hours (65 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 8a 80 d8 17 61 Error: ICRC, ABRT at LBA = 0x0117d880 = 18339968
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 98 80 da 17 60 00 00:23:04.651 READ FPDMA QUEUED
60 00 90 80 d9 17 60 00 00:23:04.651 READ FPDMA QUEUED
60 00 88 80 d8 17 60 00 00:23:04.651 READ FPDMA QUEUED
60 00 80 80 d7 17 60 00 00:23:04.651 READ FPDMA QUEUED
60 00 78 80 d6 17 60 00 00:23:04.650 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 9191 -
# 2 Short offline Completed without error 00% 9191 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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